Job Description
Responsibilities
- Perform cross‑section analysis and Scanning Electron Microscopy (SEM) inspection to monitor process health and ensure production quality.
- Handle Transmission Electron Microscopy (TEM) sample preparation using Focus Ion Beam (FIB) for detailed TEM inspection.
- Identify defects and failure mechanisms through physical failure analysis using a variety of sample de‑processing techniques and a wide range of failure analysis equipment.
- Complete physical fault isolation techniques to pinpoint and resolve issues that may impact production efficiency.
- Collaborate with engineering teams to provide timely feedback and implement solutions to maintain efficient production tool performance.
- Support the analysis of wafers with functional failures by applying various Failure Analysis tools and techniques to isolate defects and identify root causes.
- Preserve comprehensive documentation of analytical findings and approac...